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Home PeopleFacultyAdjunct/Invited Faculty

Adjunct/Invited Faculty

프린트페이스북

Bong-Jin Yum

Ph.D. in Industrial Engineering,
Ohio State University, 1981

  • IE B/D E2-2 NO.3110
  • 042-350-3116 bjyum(at)kaist.ac.kr

Education

  • 1971. 2 Seoul National University. Electrical Engineering B.S.
  • 1977. 7 Oregon State University. Industrial Engineering M.S.
  • 1981. 9 Ohio State University. Industrial Engineering Ph.D.

Research experience

  • 1981 - 1982 : Senior Researcher at Owens-Corning Fiberglas
  • 1982 - 1984 : Assistant Professor at Texas Tech Univ.
  • 1984 - Present: Professor in Dept. of Industrial and Systems Engineering, KAIST
  • 1995 - 1996 : Vice President of Korea Institute of Industrial Engineers

Research area

  • Quality Engineering(Robust Design)
  • Statistical Process Control
  • Reliability Engineering(Accelerated tests,Sampling tests)
  • Data Mining(Web Data Mining, Recommender System, ANN) / Internet QoS/Traffic Analysis

Major projects

  • Robust Design of On-line Character Recognition System , RCAI, 1994.
  • Development of Production and Process Control Systems for Semiconductor Manufacturing , MOST, 1994-1996.
  • Evaluation of R&D quality/reliability management systems , GM Daewoo, 1998-1999.
  • BK21 Internet-based Industrial Information Systems: Internet Service quality and Analysis of customers, MOST, 1999-2002.
  • Development of next generation quality innovation techniques ,MOST, 2000-2002
  • Reliability Evaluation of Products and Warranty Data Analysis (2003, Mando Corp.)
  • 쇼핑몰 데이터 분석 솔루션 알고리즘 개발(2003, (주)디엔텍세븐컨설팅)
  • iMBC 고객 데이터 분석(2003, (주)인터넷엠비씨)
  • e-CRM 데이터 분석 프로젝트(2003, (주)맥그로우컨설팅)
  • 외환은행 웹마케팅 강화 및 eCRM시스템 보강(2003, 주식회사 오픈테크)
  • 데이콤 고객 데이터 분석(2003, 비즈아이닷컴)
  • LG카드 e-CRM팀 고객 데이터 분석(2004, (주)디엔텍세븐컨설팅)
  • BK21 Internet-based Industrial Information Systems: Internet QoS, Traffic Analysis, and Recommender Systems for e-commerce , MOST, 2003-2006.

Selected publications

  • Optimal Design of Accelerated Life Tests with Two Stresses, Naval Research Logistics, 43, 863-884, 1996.
  • Control Charts for Random and Fixed Components of Variation in the Case of Fixed Wafer Locations and Measurement Positions, IEEE Trans. Semiconductor Manufacturing, 12, 214-228, 1999.
  • Comparisons of Exponential Life Test Plans with Intermittent Inspections, J. Quality Technology, 32, 217-230, 2000.
  • Evaluation Methods for Quality of Service in Telecommunications, IE Interfaces, Vol.12, 496-505, 1999.
  • Development of Reliability Design Methodology Using Accelerated Life Testing and Taguchi Method,Journal of the Korean Institute of Industrial Engineers, Vol. 288, 408-415, 2002.

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